Showing results: 586 - 600 of 867 items found.
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Series 547 -
Aries
Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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Amida Technology, Inc.
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Sensors -
Foerster Instruments, Incorporated
We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.
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Array Solutions
Thank you and congratulations for purchasing this Array Solutions Premium Balun. We are proud to produce the finest balun on the market - and back it up with a Lifetime Warranty. These baluns are designed to have less loss and we use no fragile components in them to avoid damage from lightning. We build and test every one ofthem in our factory. None of them are built outside or overseas.
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ECAD System 2002 -
CM Technologies Inc.
The ECAD System 2002 is a portable, ruggedized tester that can be used for troubleshooting and condition monitoring of installed circuits, cables and wiring harness. The ECAD tester is a combination of traditional electrical measurements, a database for storing test results, and data analysis software. This powerful combination allows a user to evaluate the condition of all circuit components in a logical and straightforward manner from one end of the circuit.
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32115 -
Parallax Inc.
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
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TS-1650 -
Testek Solutions
Testek’s NextGen TS-1650, LRM & CATE series provides economical and high speed, certified correct testing of a wide range of aircraft avionics and control components. The Testek ATE family are universal, automatic test systems, one of which is best for your application. UTC Aerospace formerly known as Hamilton Sundstrand approves and recommends Testek’s TS-1650, LRM & CATE series.
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UTM -
Tinius Olsen
Tinius Olsen is the leading specialist manufacturer and supplier of static tension and/or compression materials testing machines. Our machines are designed for use in research departments and quality control departments to measure the strength and product performance of materials. Using Tinius Olsen equipment it is possible to perform such tests on raw materials such as metals, polymers, textiles, rubbers, adhesives and food as well as finished components.
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Keysight Technologies
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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Keysight Technologies
With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Mensor Corp.
Testing altitude and airspeed components in commercial and military air data applications are critical for the safety and performance of an aircraft. Mensor air data test set and indicators provide the high accuracy necessary for these applications. Air Data Test Sets control altitude /altitude rate and airspeed /airspeed rate, for testing altimeters and airspeed indicators or air data computers in a dynamic way that simulates actual flying conditions. Air data Indicators measure Altitude /Altitude Rate and Airspeed /Airspeed Rate for applications where conditions are externally controlled.
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804B -
Teledyne LeCroy quantumdata
The Teledyne LeCroy rack mountable quantumdata 804B video test generator is optimized for testing modern HDMI flat panel TVs. The 804B video test generator supports testing of HDMI resolutions operating up to 600 MHz. This enables testing ultra HD TVs with 4K resolutions at 50/60Hz using HDMI 2.0 4:4:4 pixel encoding. The 804B supports analog component YPbPr pixel rates up to 75 MHz and RGB analog outputs at pixel rates up to 162 MHz.
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KRD41 series -
CME Technology Co. Ltd.
KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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ATEasy -
Marvin Test Solutions, Inc.
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Special mechanical systems/solutions -
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
